Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Our experimental attenuated-total-internal-reflection curves for Ag films are reanalyzed to include the thin contamination layer which has been proposed by W. H. Weber to account for the observed differences in the optical constants at the metal-air and metal-liquid interfaces. In contradiction to Weber's claim, the Drude parameters of the Ag film still show the same behavior as when this adlayer is ignored. © 1986 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999