Conference paper
Magnetoresistive sensor based scanning probe microscopy
D.R. Sahoo, A. Sebastian, et al.
NANO 2009
A new reduced-complexity decoding algorithm for low-density parity-check codes that operates entirely in the log-likelihood domain is presented. The computationally expensive check-node updates of the sum-product algorithm are simplified by using a difference-metric approach on a two-state trellis and by employing the dual-max approximation. The dual-max approximation is further improved by using a correction factor that allows the performance to approach that of full sum-product decoding.
D.R. Sahoo, A. Sebastian, et al.
NANO 2009
A. Sebastian, A. Pantazi, et al.
CCA-CACSD-ISIC 2006
E. Eleftheriou, Th. Antonakopoulos, et al.
APMRC 2002
Nikolaos Papandreou, H. Pozidis, et al.
IMW 2011