Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
The present status of ellipsometric measurement capability is reviewed. Significant advances since the last ellipsometry conference are highlighted. © 1980.
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
A. Reisman, M. Berkenblit, et al.
JES
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering