J. Tersoff, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Scanning tunneling microscopy is used to confirm the -bonded chain structure of the Si(111)2×1 surface. Both the amplitude and voltage dependence of the vertical corrugation exclude the buckling model for the structure of this surface. Spectroscopic measurements of the tunneling current versus voltage identify a band gap for the 2×1 surface states. Spatial images of disorder-related states are obtained by tunneling at energies inside of this band gap. © 1986 The American Physical Society.
J. Tersoff, R.M. Feenstra, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
M.M.T. Loy, T.F. Heinz, et al.
CLEO 1984
P. Mårtensson, R.M. Feenstra
Journal of Microscopy
R.M. Feenstra, G. Meyer, et al.
Physical Review B - CMMP