M.A. Tischler, R.T. Collins
Solid State Communications
Paper
Raman scattering from H or O terminated porous Si
Abstract
The dependence of the crystalline structure of porous Si on the bonding of surface Si atoms to either H or O has been studied by Raman spectroscopy. H terminated porous Si shows microcrystalline character while O terminated porous Si shows atomic disorder within the Si particles.
Related
S. Shapira, U. Sivan, et al.
Surface Science
D.R. Knebel, P.N. Sanda, et al.
IEEE ITC 1998
J.C. Tsang, C. Hermann, et al.
Physical Review Letters