Journal of Applied Physics

Paper

29 Jun 2004

Quantitative determination of evaporated Si films by neutron activation

View publication

Abstract

No abstract available.

Paper

Experimental determination of the atomic structure of a H-terminated Si{111} surface

F. Jona, W.A. Thompson, et al.

Physical Review B

Paper

Structure analysis of Ge(111)11-H by low-energy electron diffraction

R. Imbihl, J.E. Demuth, et al.

Physical Review B

Paper

Growth mode and atomic structure of ultrathin Fe films on Rh{001} determined by quantitative low-energy electron diffraction

A.M. Begley, S.K. Kim, et al.

Physical Review B

Paper

Kinetics of vapor-solvent growth in the system ZnS:HCl

F. Jona

Journal of Physics and Chemistry of Solids

View all publications