J. Sokolov, H.D. Shih, et al.
Solid State Communications
Paper
Pyrometric measurements of si, ge, and gaas wafers between 100°and 700°c
Abstract
No abstract available.
Related
D.W. Jepsen, P.M. Marcus, et al.
Physical Review B
A.M. Begley, D. Tian, et al.
Surface Science
W.S. Yang, F. Jona, et al.
Physical Review B