PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperFerrimagnetic resonance relaxation in rare-earth iron garnetsP.E. SeidenJournal of Applied Physics
ReviewTwo-level systems in the mechanical properties of silicon at low temperaturesRobert W. KeyesPhysical Review Letters