Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Ronald Troutman
Synthetic Metals
Imran Nasim, Melanie Weber
SCML 2024
A. Reisman, M. Berkenblit, et al.
JES