Julien Autebert, Aditya Kashyap, et al.
Langmuir
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Julien Autebert, Aditya Kashyap, et al.
Langmuir
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry