John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Michael E. Henderson
International Journal of Bifurcation and Chaos in Applied Sciences and Engineering
Charles A Micchelli
Journal of Approximation Theory