Y.Y. Li, K.S. Leung, et al.
J Combin Optim
No abstract available.
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Kenneth L. Clarkson, K. Georg Hampel, et al.
VTC Spring 2007
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence