IBM J. Res. Dev

Editorial

01 May 2020

Preface: Summit and Sierra Supercomputers

Conference paper

Evaluation of (110) versus (001) Channel Orientation for Improved nFET/pFET Device Performance Trade-Off in Gate-All-Around Nanosheet Technology

Shogo Mochizuki, Nicolas Loubet, et al.

IEDM 2023

Conference paper

CFD Simulation Analysis of Inter/Intra Chip Liquid Cooling for 3D Stacked ICs

Risa Miyazawa, Hiroyuki Mori, et al.

iTHERM 2023

Paper

Near-Data Processing: Insights from a MICRO-46 Workshop

Rajeev Balasubramonian, Jichuan Chang, et al.

IEEE Micro

Conference paper

Compressive Diffusion Break Stressor for Gate-All-Around Nanosheet pFET Transistor Performance Improvement

S. Hung, S. Mochizuki, et al.

VLSI Technology and Circuits 2025

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