PaperReduced electromigration of Cu wires by surface coatingC.-K. Hu, L. Gignac, et al.Applied Physics Letters
Conference paperMeasurements of carrier transport in MOSFETs with bottom-up nanowire channel as a function of the nanowire diameterG.M. Cohen, S. Bangsaruntip, et al.DRC 2008
Conference paperHigh performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scalingS. Bangsaruntip, G.M. Cohen, et al.IEDM 2009
Conference paperElectromigration reliability in nanoscale Cu interconnectsC.-K. Hu, L. Gignac, et al.MRS Fall Meeting 2007