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FETs with superconducting channels
A.W. Kleinsasser, T.N. Jackson
IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits 1989
Paper
Potential imaging of pentacene organic thin-film transistors
Abstract
Potential imaging of pentacene organic thin-film transistors was studied. An atomic force microscopy (AFM) was operated with a conductive tip in noncontact mode in scanning Kelvin probe microscopy (SKPM). The potential measured at the source and drain contacts was approximately constant with small variations related to the surface potential of the pentacene film.
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