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SPIE Optical Materials for High Average Power Lasers 1992
Light incident on a total internal reflection surface will tunnel through a submicrometre gap in the presence of a dielectric surface. This tunnelling phenomenon is used in the photon tunnelling microscope to image polyethylene single crystals, providing a topographical map of the single-crystal surface. Tunnelling increases exponentially with sample height and is quantified using video photometry of the grey-scale tunnelling image. © 1994.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
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