Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Light incident on a total internal reflection surface will tunnel through a submicrometre gap in the presence of a dielectric surface. This tunnelling phenomenon is used in the photon tunnelling microscope to image polyethylene single crystals, providing a topographical map of the single-crystal surface. Tunnelling increases exponentially with sample height and is quantified using video photometry of the grey-scale tunnelling image. © 1994.
T.N. Morgan
Semiconductor Science and Technology
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Ming L. Yu
Physical Review B