Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed. © 1988 Springer-Verlag.
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
T.N. Morgan
Semiconductor Science and Technology