The DX centre
T.N. Morgan
Semiconductor Science and Technology
A multiple-wavenumber analysis method for scanned-angle photoelectron holography is refined to image the near-surface atoms at a Cu(001) crystal face. The atoms one layer above the emitter are imaged at the appropriate location although shifted by 0.2Å. To strengthen this analysis, a comparison is made with a simple model which gives a similar result. A theoretical study is also presented that demonstrates why a holographic analysis scheme for scanned-angle diffraction patterns tends to preferentially image forward scattering atoms unlike scanned-energy variants of holographic atom imaging. © 1995.
T.N. Morgan
Semiconductor Science and Technology
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993