R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
The structure of the initial persistent radicals observed upon UV irradiation of poly(dialkylsilane)s (R2Si)n in solution, at any wavelength absorbed, is -SiR2-SiR-SiR2- as determined by EPR and ENDOR spectroscopy. A mechanism proposed for their formation consists of several steps, initiated by a new photochemical chain-breaking process, reductive elimination on a Si-Si-C unit, with the formation of trialkylsilyl terminal groups. The presence of such terminal groups in the irradiated product was established by GC-MS analysis after exhaustive irradiation at 254 nm. © 1988, American Chemical Society. All rights reserved.
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000