S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
An investigation of waveguide phase-shifting techniques was conducted for the purpose of establishing the design criteria for a device capable of meeting the following specifications: a phase-shift variable over a minimum range of 360° and a maximum phase error of ±5° at any phase setting over at last a 10 per cent frequency bandwidth. The dielectric loaded waveguide is the basis of a device which meets the design requirements. In this paper the analytical expressions applicable to the dielectric loaded waveguide cross section are derived using the transverse resonance procedure. A rigorous description of the propagation characteristics of this structure for various parameter values is obtained through the use of a high-speed computing machine. The excellent correlation between computed values and the data obtained from an experimental model is presented. © 1962, IEEE. All rights reserved.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
E. Burstein
Ferroelectrics
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989