Yunan Ye, Hengzhi Pei, et al.
AAAI 2020
This paper presents approaches for design of Accelerated Life Testing (ALT) plans under progressive censoring when test units experience competing failure modes. A new optimization criterion for the design of ALT plans is proposed. Optimal test plans for different objectives are formulated and obtained.
Yunan Ye, Hengzhi Pei, et al.
AAAI 2020
Baoyu Jing, Yuchen Yan, et al.
AAAI 2024
Baoyu Jing, Hanghang Tong, et al.
WWW 2021
Pei Yang, Hasan Davulcu, et al.
IEEE TKDE