J.K. Gimzewski, R. Möller, et al.
Surface Science
Subwave length-resolution optical image recording is demonstrated by moving an extremely narrow aperture along a test object equipped with fine-line structures. Details of 25-nm size can be recognized using 488-nm radiation. The result indicates a resolving power of at least λ/20 which is to be compared with the values of λ/2.3 obtainable in conventional optical microscopy.
J.K. Gimzewski, R. Möller, et al.
Surface Science
U.Ch. Fischer, D. Pohl
Physical Review Letters
L. Novotny, D. Pohl, et al.
Optics Letters
D. Pohl
Review of Scientific Instruments