Conference paper
Phase plates in the object plane for microlithography
M. Levenson
SPIE OE/LASE 1993
Two quantum nondemolition (QND) measurement schemes using second order optical nonlinearities are proposed and shown to fulfil hte criteria for back-action evasion in a measurement of optical amplitude. The first scheme, based on optical rectification, is very simple in principle, but yields extremely small signals with available materials. The second scheme is based on optical parametric amplication with type II phase matching. The interactions necessary for back-action evasion are provided by polarization mixing using Faraday rotation. © 1987.
M. Levenson
SPIE OE/LASE 1993
F.M. Schellenberg, C.G. Willson, et al.
Proceedings of SPIE 1989
R.M. Shelby, M. Levenson, et al.
Physical Review A
D.P. Burum, R.M. Shelby, et al.
Physical Review B