S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Paper
One-dimensional quantum localization in amorphous W-Re films
Abstract
We have examined the dependence of a resistance on the cross-sectional area and on temperature of amorphous W-Re films. We find that the data qualitatively fits the expression for one dimensional quantum localization. © 1980.
Related
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Mark W. Dowley
Solid State Communications
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007