Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
We determine the maximum spectral radius for (0,1)-matrices with k2 andk2+1 1's, respectively, and for symmetric (0,1)-matrices with zero trace and e= k 21's (graphs with e edges). In all cases, equality is characterized. © 1985.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
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PRX Quantum
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ISIT 1997