David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
No abstract available.
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence