Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Some theoretical and practical aspects of common random numbers (CRN) for variance reduction in simulation analysis are considered. A simple proof of the optimality of CRN is presented and the efficiency of this technique for variance reduction is discussed. Applications of CRN to production planning and inventory problems while using stochastic approximation are given. © 1984.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Kenneth L. Clarkson, K. Georg Hampel, et al.
VTC Spring 2007
John S. Lew
Mathematical Biosciences
A. Grill, B.S. Meyerson, et al.
Proceedings of SPIE 1989