U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
Paper
On the mechanism of diffusion-induced boundary migration
Abstract
A grain-boundary-dislocation mechanism for diffusion-induced boundary migration is proposed. It is suggested that point-defect emission from grain-boundary dislocations is necessary for the solution and transport of substitutional solutes. Grain-boundary migration occurs as a by-product of the emission of point defects, owing to the requirement that the dislocation remain in the grain-boundary plane. © 1981 Taylor & Francis Group, LLC.
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