Conference paper
Single and dual wavelength exposure of photoresist
J. LaRue, C. Ting
Proceedings of SPIE 1989
It is shown that the line graph of the complete tripartite graph Kn,n,n is characterized by the spectrum of its adjacency matrix. © 1977, Taylor & Francis Group, LLC. All rights reserved.
J. LaRue, C. Ting
Proceedings of SPIE 1989
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Shashanka Ubaru, Lior Horesh, et al.
Journal of Biomedical Informatics