Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
No abstract available.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Imran Nasim, Michael E. Henderson
Mathematics
Charles Micchelli
Journal of Approximation Theory
R.A. Brualdi, A.J. Hoffman
Linear Algebra and Its Applications