Steven E. Laux, Wai Lee
IEEE Electron Device Letters
Improved nearest-grid-point and cloud-in-cell particle-mesh schemes are suggested, and a new nearest-elementcenter scheme proposed, to help reduce self force and improve the spatial accuracy of forces in Monte Carlo semiconductor device simulation. These schemes are exercised on both oneand two-dimensional model problems. An attempt to design a scheme with reduced self force for unstructured triangular meshes is unsuccessful. © 1996 IEEE.
Steven E. Laux, Wai Lee
IEEE Electron Device Letters
Arvind Kumar, Steven E. Laux, et al.
Physical Review B
Steven E. Laux
IEEE TCADIS
Steven E. Laux, Arvind Kumar, et al.
IEEE TNANO