John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Vladimir Yanovski, Israel A. Wagner, et al.
Ann. Math. Artif. Intell.