Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Let A=(aij) be a real symmetric matrix of order n. We characterize all nonnegative vectors x=(x1,...,xn) and y=(y1,...,yn) such that any real symmetric matrix B=(bij), with bij=aij, i≠jhas its eigenvalues in the union of the intervals [bij-yi, bij+ xi]. Moreover, given such a set of intervals, we derive better bounds for the eigenvalues of B using the 2n quantities {bii-y, bii+xi}, i=1,..., n. © 1981.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
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