Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Paper
On a connection between facility location and perfect graphs
Abstract
We characterize the graphs for which a linear relaxation of a facility location problem defines a polytope with all integral extreme points. We use a transformation to a stable set problem in perfect graphs. Based on this transformation, these graphs can be recognized in polynomial time.
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