Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Angle-resolved photoelectron spectroscopy and k-resolved inverse photoemission have been used to study the electronic structure of the Si(100)×1 surface. For both techniques, one occupied and one unoccupied surface-state band has been mapped along the [010] and [011] directions. The surface shows semiconducting behavior with an estimated minimum band gap of 1.45 eV along the [010] direction. © 1993 The American Physical Society.
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Ming L. Yu
Physical Review B
E. Burstein
Ferroelectrics
A. Gangulee, F.M. D'Heurle
Thin Solid Films