Siegfried Karg, Philipp Mensch, et al.
Journal of Electronic Materials
We report on the structural characterization of GaAs nanowires integrated on Si(001) by template-assisted selective epitaxy. The nanowires were grown in lateral SiO2 templates along [110] with varying V/III ratios and temperatures using metal-organic chemical vapor deposition. The nanowires have been categorized depending on the growth facets which typically consisted of (110) and (111)B planes. Nanowires exhibiting a (111)B growth facet were found to have high density planar defects for all growth conditions investigated. However, GaAs nanowires with a single (110) growth facet were grown without the formation of planar stacking faults, resulting in a pure zinc blende crystal.
Siegfried Karg, Philipp Mensch, et al.
Journal of Electronic Materials
Emmanuel Delamarche, André Bernard, et al.
JACS
M. Scherrer, Seonyeong Kim, et al.
OFC 2022
Siegfried Karg, Vanessa Schaller, et al.
ESSDERC 2016