Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
We report the observation of a peak in the real part of the in-plane rf-conductivity, Re{σ(T)} of YBaCuO thin films. The measurements were made on high-quality films in the frequency range from 100 kHz to 500 MHz. The peak was detected at frequencies up to 500 MHz but was substantially sharper and larger at lower frequencies. All peaks were narrower (∼0.5 K) than expected from the BCS quasiparticle density of states (∼30 K), i.e. the Hebel-Slichter peak. However, they could be interpreted as a measurement artifact resulting from a broadening of the resistive tramsition. © 1991.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992