G. Grinstein, John Toner
Physical Review Letters
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
G. Grinstein, John Toner
Physical Review Letters
G. Grinstein, R.A. Pelcovits
Physical Review A
M. Büttiker, Y. Imry, et al.
Physics Letters A
T. Bohr, G. Grinstein, et al.
Chaos