G.A. Held, G. Grinstein, et al.
PNAS
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
G.A. Held, G. Grinstein, et al.
PNAS
G. Grinstein, Yuhai Tu, et al.
Physical Review Letters
G. Grinstein, Z.-W. Lai, et al.
Physical Review A
Yuhai Tu, G. Grinstein, et al.
Physical Review Letters