Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
A systematic study of quadrature formulae for the Wiener integral ∫ F[x]w(dx) of the type ∫F[θ6(u, .) ]v(du) is presented. The Cameron and Vladimirov quadrature formulae, which are the function space analogues of Simpson’s Rule, are shown to fit into this framework. Numerical results are included. © 1967, AMS Publisher. All rights reserved.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Shashanka Ubaru, Lior Horesh, et al.
Journal of Biomedical Informatics
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990