Conference paper
Roughness analysis of Si1-xGex films
R.M. Feenstra, M.A. Lutz, et al.
MRS Fall Meeting 1994
We have investigated the effect of H passivation on the deposition of Co on Si(111). The H terminated surface has fewer nucleation sites for silicide formation than either the bare (7×7) surface or the boron (3×3)R30°. This leads to a growth mode dominated by the formation of sparse nonepitaxial islands, which grow laterally to merge. The H passivated (1×1) surface does not contain Si adatoms, unlike the (7×7) and boron (3×3)R30°surfaces, which must be the nucleation site for cobalt silicide formation on Si(111). © 1994 American Institute of Physics.
R.M. Feenstra, M.A. Lutz, et al.
MRS Fall Meeting 1994
A.J. Schell-Sorokin, R.M. Tromp
Surface Science
M. Copel, K.P. Rodbell, et al.
Applied Physics Letters
R.M. Tromp, G.W. Rubloff, et al.
JVSTA