Leo Gross, Fabian Mohn, et al.
Nature Chemistry
Paper
Novel optical approach to atomic force microscopy
Abstract
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Related
Gerhard Meyer, Nabil M. Amer
Applied Physics Letters
Marek Gajdoš, Andreas Eichler, et al.
Physical Review B - CMMP
Jascha Repp, Gerhard Meyer
Chimia