R.L. Melcher
International Conference on Laser Processing and Diagnostics 1983
A noncontact thermal imaging system using infrared detection is described. The system uses a chopped and scanned electron beam as a heat source to produce a temperature pattern on the surface of the sample. The resulting thermal radiation is detected and used for numerical image reconstruction of the sample's subsurface structure.
R.L. Melcher
International Conference on Laser Processing and Diagnostics 1983
G. Gorodetsky, Jerzy Kanicki, et al.
Applied Physics Letters
Gerald Burns, C.R. Wie, et al.
Applied Physics Letters
Gerald Burns, F.H. Dacol, et al.
Physical Review B