Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The new perovskite-related layered phase Sr3Ru2O7 has been prepared and characterised: electron microscopy and powder X-ray diffraction shows it to be isostructural with Sr3Ti2O7. This n = 1 structure represents the upper limit of layer thickness for well-ordered material in the homologous series which includes Sr2RuO4 and SrRuO3, the n = 0 and n = ∞ end-members. Preparations between Sr3Ru2O7 and SrRuO3 are highly disordered, comprising a wide variety of different layer-thicknesses. © 1991.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
J. Tersoff
Applied Surface Science
R. Ghez, M.B. Small
JES