Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
P.C. Pattnaik, D.M. Newns
Physical Review B
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B