J.A. Barker, D. Henderson, et al.
Molecular Physics
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
J.A. Barker, D. Henderson, et al.
Molecular Physics
T. Schneider, E. Stoll
Physical Review B
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007