Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
R.W. Gammon, E. Courtens, et al.
Physical Review B
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT