R.W. Gammon, E. Courtens, et al.
Physical Review B
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
R.W. Gammon, E. Courtens, et al.
Physical Review B
K.A. Chao
Physical Review B
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science