David A. Selby
IBM J. Res. Dev
Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on the grid reduces noise margin and increases gate delay, resulting in a serious performance impact. Checking the integrity of the supply voltage using traditional circuit simulation is not practical, for reasons of time and memory complexity. We propose a novel multigrid-like technique for the analysis of power grids. The grid is reduced to a coarser structure, and the solution is mapped back to the original grid. Experimental results show that the proposed method is very efficient as well as suitable for both DC and transient analysis of power grids.
David A. Selby
IBM J. Res. Dev
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Liqun Chen, Matthias Enzmann, et al.
FC 2005
Arun Viswanathan, Nancy Feldman, et al.
IEEE Communications Magazine