R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics