Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
Mark W. Dowley
Solid State Communications
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals