Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Eloisa Bentivegna
Big Data 2022
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008