M.V. Fischetti, S.E. Laux, et al.
IEDM 2003
An improved closure relation - based on the entropy principle - is implemented in a Hydrodynamic model for electron transport. Steady-state electron transport in the "benchmark" n+- n - n+ submicron silicon diode is simulated and the quality of the model is assessed by comparison with Monte Carlo results.
M.V. Fischetti, S.E. Laux, et al.
IEDM 2003
J.C. Tsang, M.V. Fischetti
Microelectronics Reliability
D.J. Frank, S.E. Laux, et al.
IEEE Transactions on Electron Devices
N. Sano, M.V. Fischetti, et al.
IWCE 1998