M. Yang, J. Schaub, et al.
VLSI Technology 2003
High-performance interdigitated metal-semiconductor-metal detectors and photoreceivers have been fabricated using a standard refractory-gate, ion-implanted MESFET process which was also used to fabricate complex digital circuits. A rise time of 110 ps has been observed for a detector-preamplifier combination, implying a small-signal bandwidth of about 3 GHz. Detector responsivities as high as 0. 45 A/W, and dark currents as low as 5 nA have been observed.
M. Yang, J. Schaub, et al.
VLSI Technology 2003
B. Yang, J. Schaub, et al.
IEEE Photonics Technology Letters
J.D. Crow, L. Comerford, et al.
Proceedings of SPIE 1989
D.L. Rogers, S. Walker, et al.
IEE/LEOS Summer Topical Meetings 1994