PaperAn x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materialsJ. Feng, E. Forest, et al.Journal of Physics Condensed Matter
PaperExploring the microscopic origin of exchange bias with photoelectron emission microscopy (invited)A. Scholl, F. Nolting, et al.Journal of Applied Physics
Conference paperDesign and analysis of beam separator magnets for third generation aberration compensated PEEMsY.K. Wu, D.S. Robin, et al.Nucl. Instrum. Methods Phys. Res
Conference paperDesign and analysis of beam separator magnets for third generation aberration compensated PEEMsY.K. Wu, D.S. Robin, et al.Nucl. Instrum. Methods Phys. Res
