Conference paper
High speed device testing and internal node diagnostics
George Chiu, Jean-Marc Halbout, et al.
Microlithography 1987
Paper
Modal Dispersion and Attenuation Measurements of Silicon Nitride and Silicon Oxynitride Waveguides Using a Streak Camera
Abstract
Attenuation and dispersion characteristics for different modes of dielectric waveguides fabricated on silicon have been characterized by measuring the propagation of short pulses using a synchroscan streak camera. © 1990, IEEE
Related
G.V. Treyz, P.G. May, et al.
Applied Physics Letters
Paul May, Jean-Marc Halbout, et al.
IEEE T-ED
George Chiu, Jean-Marc Halbout, et al.
Microelectronic Engineering