J. Rühe, G.S. Blackman, et al.
Journal of Applied Polymer Science
Migration of very thin ( <30 nm) polymeric films on solid surfaces was investigated quantitatively using two techniques-scanning microellipsometry and scanning small spot x-ray photoemission spectroscopy. The surface diffusion coefficient Ds increases as the film thickness decreases down to 1 nm, however, below 1 nm, Ds becomes independent of polymer film thickness. The functional dependence of Ds with molecular weight M is described, over the limited range of M in the unentangled regime, by M -1.7 The activation energy for polymer segment hopping is about 41 kJ/mol, which is similar to values obtained from bulk self-diffusion of other polymers. © 1990 American Institute of Physics.
J. Rühe, G.S. Blackman, et al.
Journal of Applied Polymer Science
Susan M. Holl, R.D. Johnson, et al.
MRS Spring Meeting 1994
Tom Karis, V. Novotny
Journal of Applied Physics
V. Novotny, A.S. Kao
IEEE Transactions on Magnetics